Author :
Domenico, R. ; Henle, R.
Author_Institution :
IBM, Poughkeepsie, NY, USA
Keywords :
Adaptive control; Circuit faults; Control systems; Logic; Military computing; Navigation; Photoconducting devices; Photoconductivity; Programmable control; Resistors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157291