Title :
A verification strategy for fault-detection and fault-tolerance circuits
Author :
Boschi, Gabriele ; Mariani, Riccardo ; Lorenzini, Stefano
Author_Institution :
Yogitech SpA, Pisa, Italy
Abstract :
Dependability, availability, reliability and security (in a single word, robustness) are primary-importance elements for today´s Systems-on-Chip (SoCs), in different areas. To achieve robustness, functional blocks are combined with fault-detection and fault-tolerance circuits to detect or correct faults due to environmental impact, aging, soft-errors and so forth. Furthermore, systematic faults (i.e. fault whose failure is manifested in a deterministic way) shall be avoided. Fault-detection and fault-tolerance circuits´ verification is the key to achieve that goal. This paper summarizes the state-of-the-art for verification-by-simulation flow, to subsequently extend the verification strategy for fault-detection and fault-tolerance circuits.
Keywords :
integrated circuit reliability; system-on-chip; SoC; circuit reliability; fault detection circuit; fault tolerance circuit; functional blocks; systems-on-chip; verification strategy; verification-by-simulation flow; Circuit faults; Fault tolerance; Fault tolerant systems; Robustness; Safety; System-on-a-chip; Transient analysis; Coverage; Random HW failures; Reliability; Safety; Supervisors;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993834