DocumentCode :
2891146
Title :
Susceptibility Of Charge-coupled Devices To RF And Microwave Radiation
Author :
Daher, J.K. ; Champion, G.H.
Author_Institution :
Georgia Tech Research Institute Georgia Institute of Technology Atlanta, GA 30332
fYear :
1992
fDate :
17-21 Aug. 1992
Firstpage :
416
Lastpage :
422
Keywords :
Charge coupled devices; Charge-coupled image sensors; Electromagnetic measurements; Laboratories; Microwave devices; Optical imaging; Performance evaluation; Radio frequency; Semiconductor device measurement; Sensor systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-0713-5
Type :
conf
DOI :
10.1109/ISEMC.1992.626128
Filename :
626128
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2891146
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