Title :
Fault-tolerance assessment and enhancement in SoCWire interface: A system-on-chip wire
Author :
Salamat, Ronak ; Zarandi, Hamid R.
Author_Institution :
Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
Abstract :
In this paper, First an analysis of the effects of transient faults using simulation-based fault injection is presented in System-on-Chip Wire (SoCWire) and then a fault-tolerant infrastructure is mentioned and results is reported. Different fault models such as dead clause, stuck then, micro-operation, crosstalk, dead process and SET (Single Event Transient) have been used to evaluate the transient faults´ effects on SoCWire which is described in VHDL language. Besides, reported results in SoCWire show that about 47.67% of injected faults are latent; 41.71% of faults are recovered during simulation time and the remainders 10.61% of faults are effective that cause failure. The average of fault latency is 34. As it is illustrated later the percentage of failure is decreased in fault tolerant SoCWire.
Keywords :
fault tolerance; hardware description languages; system-on-chip; SET; SoC wire interface; VHDL language; fault-tolerance assessment; fault-tolerance enhancement; single event transient; system-on-chip wire; Codecs; Fault tolerance; Fault tolerant systems; Random access memory; System-on-a-chip; Transient analysis; Tunneling magnetoresistance; Fault Models; Fault-tolerance; Network on Chip; Reconfigurable System on Chip; Simulation based Fault injection; Transient fault;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993841