• DocumentCode
    2891256
  • Title

    Fault-tolerance assessment and enhancement in SoCWire interface: A system-on-chip wire

  • Author

    Salamat, Ronak ; Zarandi, Hamid R.

  • Author_Institution
    Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2011
  • fDate
    13-15 July 2011
  • Firstpage
    196
  • Lastpage
    197
  • Abstract
    In this paper, First an analysis of the effects of transient faults using simulation-based fault injection is presented in System-on-Chip Wire (SoCWire) and then a fault-tolerant infrastructure is mentioned and results is reported. Different fault models such as dead clause, stuck then, micro-operation, crosstalk, dead process and SET (Single Event Transient) have been used to evaluate the transient faults´ effects on SoCWire which is described in VHDL language. Besides, reported results in SoCWire show that about 47.67% of injected faults are latent; 41.71% of faults are recovered during simulation time and the remainders 10.61% of faults are effective that cause failure. The average of fault latency is 34. As it is illustrated later the percentage of failure is decreased in fault tolerant SoCWire.
  • Keywords
    fault tolerance; hardware description languages; system-on-chip; SET; SoC wire interface; VHDL language; fault-tolerance assessment; fault-tolerance enhancement; single event transient; system-on-chip wire; Codecs; Fault tolerance; Fault tolerant systems; Random access memory; System-on-a-chip; Transient analysis; Tunneling magnetoresistance; Fault Models; Fault-tolerance; Network on Chip; Reconfigurable System on Chip; Simulation based Fault injection; Transient fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4577-1053-7
  • Type

    conf

  • DOI
    10.1109/IOLTS.2011.5993841
  • Filename
    5993841