DocumentCode
2891256
Title
Fault-tolerance assessment and enhancement in SoCWire interface: A system-on-chip wire
Author
Salamat, Ronak ; Zarandi, Hamid R.
Author_Institution
Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2011
fDate
13-15 July 2011
Firstpage
196
Lastpage
197
Abstract
In this paper, First an analysis of the effects of transient faults using simulation-based fault injection is presented in System-on-Chip Wire (SoCWire) and then a fault-tolerant infrastructure is mentioned and results is reported. Different fault models such as dead clause, stuck then, micro-operation, crosstalk, dead process and SET (Single Event Transient) have been used to evaluate the transient faults´ effects on SoCWire which is described in VHDL language. Besides, reported results in SoCWire show that about 47.67% of injected faults are latent; 41.71% of faults are recovered during simulation time and the remainders 10.61% of faults are effective that cause failure. The average of fault latency is 34. As it is illustrated later the percentage of failure is decreased in fault tolerant SoCWire.
Keywords
fault tolerance; hardware description languages; system-on-chip; SET; SoC wire interface; VHDL language; fault-tolerance assessment; fault-tolerance enhancement; single event transient; system-on-chip wire; Codecs; Fault tolerance; Fault tolerant systems; Random access memory; System-on-a-chip; Transient analysis; Tunneling magnetoresistance; Fault Models; Fault-tolerance; Network on Chip; Reconfigurable System on Chip; Simulation based Fault injection; Transient fault;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location
Athens
Print_ISBN
978-1-4577-1053-7
Type
conf
DOI
10.1109/IOLTS.2011.5993841
Filename
5993841
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