Title :
EMI-induced Delays In Digital Circuits: Prediction
Author :
Laurin, Jean-Jacques ; Zaky, Safwat G. ; Balmain, Keith G.
Author_Institution :
Department of Electrical Engineering, University of Toronto, Toronto, Ontario
Keywords :
Circuit simulation; Coupling circuits; Digital circuits; Logic devices; Predictive models; Propagation delay; Pulse inverters; Radio frequency; Radiofrequency interference; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-0713-5
DOI :
10.1109/ISEMC.1992.626140