Title :
AC and impulse switching techniques for fixed, random access, and analog memory use
Author_Institution :
MIT Lincoln Laboratory, Lexington, MA, USA
Keywords :
Analog memory; Drives; Ferrites; Frequency; Laboratories; Signal to noise ratio; Stability; Switches; Temperature sensors; Threshold current;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157304
