DocumentCode :
2891408
Title :
A deep level reasoning tool for semiconductor process simulation
Author :
Slaughter, Stephen ; Hartzell, Robert ; Chang, Tai-Chun
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
117
Abstract :
Summary form only given. An approach is proposed which attempts to combine features found in traditional process simulators and expert systems. The result is a system which generates process-specific knowledge from physical models by the sequential execution of a process recipe. This deep-level knowledge can be used in conjunction with techniques borrowed from the artificial intelligence community to reason about a variety of domain problems. Dependency trees are generated by the sequential execution of a process recipe. These trees can be used for identifying relationships between process steps and structures, which is useful in a problem-solving domain. The system design has been optimized for speed by using both analytical and empirical models. Typical recipes can be simulated in approximately one minute. Accuracy is achieved by providing a tuning mechanism which allows the user to input actual process data as a goal for the system output. The program described offers a logical evolution over traditional simulators and should find future applications in process control and failure analysis
Keywords :
digital simulation; electronic engineering computing; expert systems; failure analysis; inference mechanisms; integrated circuit manufacture; process control; semiconductor device manufacture; deep level reasoning tool; dependency trees generation; expert systems; failure analysis; physical models; process control; process recipe; process-specific knowledge; semiconductor process simulation; sequential execution; Analytical models; Artificial intelligence; Design optimization; Expert systems; Instruments; Manufacturing processes; Problem-solving; Semiconductor device manufacture; Semiconductor process modeling; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
Conference_Location :
Burlingame, CA
Type :
conf
DOI :
10.1109/ISMSS.1989.77258
Filename :
77258
Link To Document :
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