• DocumentCode
    2891607
  • Title

    A survey of the tunnel-diode equivalent circuit

  • Author

    Baldinger, E.

  • Author_Institution
    University of Basel, Basel, Switzerland
  • Volume
    IV
  • fYear
    1961
  • fDate
    15-17 Feb. 1961
  • Firstpage
    6
  • Lastpage
    7
  • Abstract
    The DC characteristic of tunnel diodes may be explained by splitting up the total current into three fractions. Electrons pass the junction from the valence band of the n-region (Zener current) and in reverse direction (Esaki current). At a high enough forward bias, minority carrier injection will be appreciable. This current may be proportional to the summation of qV/kT provided the influence of recombination centers in the depletion layer can be neglected. Irradiation by fast neutrons will increase the number of recombination centers and will therefore increase the valley currents. It will also be noted that the tunneling process is complicated by phonon interaction and by states for electrons within the forbidden gap.
  • Keywords
    Diodes; Electrical resistance measurement; Electrons; Equivalent circuits; Phonons; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1961.1157315
  • Filename
    1157315