DocumentCode
2891607
Title
A survey of the tunnel-diode equivalent circuit
Author
Baldinger, E.
Author_Institution
University of Basel, Basel, Switzerland
Volume
IV
fYear
1961
fDate
15-17 Feb. 1961
Firstpage
6
Lastpage
7
Abstract
The DC characteristic of tunnel diodes may be explained by splitting up the total current into three fractions. Electrons pass the junction from the valence band of the n-region (Zener current) and in reverse direction (Esaki current). At a high enough forward bias, minority carrier injection will be appreciable. This current may be proportional to the summation of qV/kT provided the influence of recombination centers in the depletion layer can be neglected. Irradiation by fast neutrons will increase the number of recombination centers and will therefore increase the valley currents. It will also be noted that the tunneling process is complicated by phonon interaction and by states for electrons within the forbidden gap.
Keywords
Diodes; Electrical resistance measurement; Electrons; Equivalent circuits; Phonons; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1961.1157315
Filename
1157315
Link To Document