DocumentCode :
2892027
Title :
Progress report on thin-film circuitry
Author :
Counihan, R.
Author_Institution :
IBM Corp., Kingston, NY, USA
Volume :
IV
fYear :
1961
fDate :
15-17 Feb. 1961
Firstpage :
56
Lastpage :
57
Keywords :
Capacitors; Circuit stability; Electric shock; Fabrication; Humidity; Integrated circuit interconnections; Reproducibility of results; Resistors; Temperature; Thin film circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1961.1157338
Filename :
1157338
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2892027
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