DocumentCode :
2892028
Title :
Efficient approaches to testing VHDL DSP models
Author :
Armstrong, James R.
Author_Institution :
Virginia Tech, VA, USA
Volume :
5
fYear :
1995
fDate :
9-12 May 1995
Firstpage :
2865
Abstract :
Generation of test benches for large DSP behavioral models is a complicated, labor intensive task. Also, tests generated manually satisfy no formal definition of completeness. To address these needs, high level approaches to test bench development are employed which relieve the modeler of the details of this task. CASE tools are used to develop the test bench VHDL code, i.e., state machine behavior is specified with Ilogix Express VHDL and sensor behavior with Comdisco SPW. An intelligent interface prompts the user for high level test bench information, and inserts this information into the test bench code. The intelligent interface also allows the user to specify and control file I/O as a data source. Conceptually speaking, two approaches are being explored: (1) behavioral-the CASE tools develop complete high level models of the test bench, and (2) structural-a library of primitive components is developed so that a conventional schematic capture tool, e.g., Synopsys Graphical Environment, can be used to construct the test bench
Keywords :
automatic testing; computer aided software engineering; electronic engineering computing; formal verification; hardware description languages; signal processing; CASE tools; Comdisco SPW; Ilogix Express VHDL; Synopsys Graphical Environment; VHDL DSP models; behavioral models; high level approaches; intelligent interface; schematic capture tool; sensor behavior; state machine behavior; test benches; testing; Computer aided software engineering; Digital signal processing; Hardware; Intelligent sensors; Libraries; Machine intelligence; Signal generators; Signal processing; Signal processing algorithms; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1995. ICASSP-95., 1995 International Conference on
Conference_Location :
Detroit, MI
ISSN :
1520-6149
Print_ISBN :
0-7803-2431-5
Type :
conf
DOI :
10.1109/ICASSP.1995.479442
Filename :
479442
Link To Document :
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