• DocumentCode
    2892044
  • Title

    High frequency measurements and characterization of transistors

  • Volume
    IV
  • fYear
    1961
  • fDate
    15-17 Feb. 1961
  • Firstpage
    52
  • Lastpage
    52
  • Abstract
    Presents information session listings for the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1961.1157339
  • Filename
    1157339
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2892044