Title :
Rapid-transfer principles for transistor switching circuits
Author :
Rapp, A. ; Robinson, J.
Author_Institution :
Philco Corp., Philidelphia, PA, USA
Keywords :
Circuit testing; Clocks; Counting circuits; Digital systems; Diodes; Logic circuits; Switches; Switching circuits; System testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157347
