Title :
Determination of switching speed of transistors by stored charge and effective lifetime
Author :
Hwang, Yuh-Shyan ; Cleverley, D. ; Monsour, D.
Author_Institution :
General Electric Co., Syracuse, NY, USA
Keywords :
Charge measurement; Current measurement; Germanium alloys; Probes; Q measurement; Sampling methods; Solid state circuits; Switching circuits; Velocity measurement; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157348
