DocumentCode
2892238
Title
Determination of switching speed of transistors by stored charge and effective lifetime
Author
Hwang, Yuh-Shyan ; Cleverley, D. ; Monsour, D.
Author_Institution
General Electric Co., Syracuse, NY, USA
Volume
IV
fYear
1961
fDate
15-17 Feb. 1961
Firstpage
80
Lastpage
81
Keywords
Charge measurement; Current measurement; Germanium alloys; Probes; Q measurement; Sampling methods; Solid state circuits; Switching circuits; Velocity measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1961.1157348
Filename
1157348
Link To Document