DocumentCode :
2892316
Title :
Current Mode On-Chip Interconnect using Level-Encoded Two-Phase Dual-Rail Encoding
Author :
Nigussie, Ethiopia ; Plosila, Juha ; Isoaho, Jouni
Author_Institution :
Dept. of Inf. Technol., Univ. of Turku, Turku
fYear :
2007
fDate :
27-30 May 2007
Firstpage :
649
Lastpage :
652
Abstract :
We present delay variations insensitive long on-chip interconnect implementation based on current mode signaling and level-encoded two-phase dual-rail (LEDR) encoding. LEDR encoding is chosen over the normal two-phase dual-rail encoding because its completion detection and decoding circuitry is faster and much simpler since detection is level based rather than transition. The communication latency of this interconnect at global lengths of the wires reduces by half compared to conventional voltage mode LEDR interconnect. This is due to current mode signaling, making it possible to achieve high speed without pipelining and/or using repeaters. Performance simulation shows that at 5 mm wire length the throughput of this interconnect is 1 Gbps per one dual-rail wire pair. The effect of crosstalk on signal propagation delay is analyzed using four-bit parallel data transfer with the worst-case switching pattern and transmission line model which have both capacitive and inductive coupling. The interconnect circuitry is designed and simulated using Cadence Analog Spectre and Hspice with 130 nm CMOS technology.
Keywords :
CMOS integrated circuits; crosstalk; current-mode circuits; encoding; integrated circuit design; integrated circuit interconnections; system-on-chip; 130 nm CMOS technology; Cadence Analog Spectre simulation; Hspice simulation; LEDR encoding; capacitive coupling; communication latency; crosstalk; current mode long on-chip interconnect; current mode signaling; decoding circuitry; four-bit parallel data transfer; inductive coupling; interconnect circuitry design; level-encoded two-phase dual-rail encoding; reliability; signal propagation delay; size 130 nm; system-on-chip interconnect; transmission line model; worst-case switching pattern; CMOS technology; Decoding; Delay; Encoding; Integrated circuit interconnections; Pipeline processing; Repeaters; Throughput; Voltage; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
Type :
conf
DOI :
10.1109/ISCAS.2007.377892
Filename :
4252718
Link To Document :
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