Title :
An evaporated film 135-cryotron memory plane
Author_Institution :
IBM Corp., Kingston, NY, USA
Keywords :
Automatic control; Circuit testing; Control systems; Persistent currents; Pressure control; Read-write memory; Substrates; Superconductivity; Thickness control; Transistors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157352