Title :
The characteristics of Esaki diodes at microwave frequencies
Author_Institution :
Sony Corp., Tokyo, Japan
Keywords :
Admittance measurement; Capacitance; Diodes; Equivalent circuits; Frequency measurement; Inductance; Laboratories; Microwave frequencies; Telephony; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157357
