Title :
Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCOS IC product
Author :
Ker, Ming-Dou ; Chen, Shih-Hung ; Tseng, Tang-Kui
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6 μm×16841.5 μm has been proposed and practically verified in 0.35-μm 3.3 V/12 V CMOS process. This LCoS IC with both low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5 kV and 200 V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.
Keywords :
CMOS integrated circuits; electrostatic discharge; high definition television; integrated circuit design; liquid crystal displays; liquid crystal on silicon; 0.35 micron; 200 V; 3.5 kV; CMOS process; HBM; HV ESD protection circuits; LV ESD protection circuits; UXGA-HDTV LCOS IC product; high definition television; human body model; machine model; whole chip ESD protection circuit design; CMOS integrated circuits; CMOS process; Circuit synthesis; Circuit testing; Electrostatic discharge; HDTV; Integrated circuit testing; Liquid crystal on silicon; Protection; Stress;
Conference_Titel :
Circuits and Systems, 2004. Proceedings. The 2004 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-8660-4
DOI :
10.1109/APCCAS.2004.1413011
