Title :
New forms of all-transistor logic
Author :
Beeson, R. ; Ruegg, H.
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Cameras; Instruments; Leakage current; Logic circuits; Logic design; Power supplies; Resistors; Semiconductor diodes; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1962 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1962.1157368
