DocumentCode
2892834
Title
Spur-free all-digital PLL in 65nm for mobile phones
Author
Staszewski, Robert Bogdan ; Waheed, Khurram ; Vemulapalli, Sudheer ; Dulger, Fikret ; Wallberg, John ; Hung, Chih-Ming ; Eliezer, Oren
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
fYear
2011
fDate
20-24 Feb. 2011
Firstpage
52
Lastpage
54
Abstract
After the first-ever all-digital PLL (ADPLL) [1] for Bluetooth radios has proven benefits of CMOS scaling and integration, demonstrators for more challenging wireless standards have emerged [2-6]. In the ADPLL, however, the digitally controlled oscillator (DCO) and time-to-digital converter (TDC) quantize the time and frequency tuning functions, respectively, which can lead to spurious tones and phase noise increase. As such, finite TDC resolution can distort data modu lation and spectral mask at near integer-N channels, while finite DCO step size can add far-out spurs and phase noise. Also, a major underreported issue is an injection pulling of the DCO due to harmonics of the digital activity at closely spaced frequencies, which can also create spurs. This work addresses all these problems and demonstrates RF performance matching that of the best-in-class traditional approaches.
Keywords
Bluetooth; CMOS integrated circuits; digital phase locked loops; mobile radio; oscillators; phase noise; tuning; ADPLL; Bluetooth radios; CMOS integration; CMOS scaling; RF performance matching; closely spaced frequency; data modulation; digital activity; digitally controlled oscillator; far-out spurs; finite DCO step size; finite TDC resolution; frequency tuning functions; mobile phones; near integer-N channels; phase noise; spectral mask; spur-free all-digital PLL; spurious tones; time tuning functions; time-to-digital converter; wireless standards; Clocks; Conferences; Converters; GSM; Noise; Phase locked loops; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-61284-303-2
Type
conf
DOI
10.1109/ISSCC.2011.5746215
Filename
5746215
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