• DocumentCode
    2892834
  • Title

    Spur-free all-digital PLL in 65nm for mobile phones

  • Author

    Staszewski, Robert Bogdan ; Waheed, Khurram ; Vemulapalli, Sudheer ; Dulger, Fikret ; Wallberg, John ; Hung, Chih-Ming ; Eliezer, Oren

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    20-24 Feb. 2011
  • Firstpage
    52
  • Lastpage
    54
  • Abstract
    After the first-ever all-digital PLL (ADPLL) [1] for Bluetooth radios has proven benefits of CMOS scaling and integration, demonstrators for more challenging wireless standards have emerged [2-6]. In the ADPLL, however, the digitally controlled oscillator (DCO) and time-to-digital converter (TDC) quantize the time and frequency tuning functions, respectively, which can lead to spurious tones and phase noise increase. As such, finite TDC resolution can distort data modu lation and spectral mask at near integer-N channels, while finite DCO step size can add far-out spurs and phase noise. Also, a major underreported issue is an injection pulling of the DCO due to harmonics of the digital activity at closely spaced frequencies, which can also create spurs. This work addresses all these problems and demonstrates RF performance matching that of the best-in-class traditional approaches.
  • Keywords
    Bluetooth; CMOS integrated circuits; digital phase locked loops; mobile radio; oscillators; phase noise; tuning; ADPLL; Bluetooth radios; CMOS integration; CMOS scaling; RF performance matching; closely spaced frequency; data modulation; digital activity; digitally controlled oscillator; far-out spurs; finite DCO step size; finite TDC resolution; frequency tuning functions; mobile phones; near integer-N channels; phase noise; spectral mask; spur-free all-digital PLL; spurious tones; time tuning functions; time-to-digital converter; wireless standards; Clocks; Conferences; Converters; GSM; Noise; Phase locked loops; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-61284-303-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.2011.5746215
  • Filename
    5746215