Title :
Magnetoresistive readout of thin-film memories
Author_Institution :
Phillip Research Laboratories,Eindhoven, Holland
Keywords :
Circuits; Electrical resistance measurement; Magnetic field measurement; Magnetic films; Magnetic properties; Magnetization; Magnetoresistance; Transistors; Wire; Writing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1962 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1962.1157382