• DocumentCode
    2892988
  • Title

    Dynamic hit logic with embedded 8Kb SRAM in 45nm SOI for the zEnterprise™ processor

  • Author

    Pelella, Antonio R. ; Chan, Yuen H. ; Balakrishnan, Bargav ; Patel, Pradip ; Rodko, Daniel ; Serton, Richard E.

  • Author_Institution
    IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
  • fYear
    2011
  • fDate
    20-24 Feb. 2011
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    With the push to ever higher core frequencies, more logic functions are making their way onto critical path SRAMs in the L1 cache look up structure. Described in this paper is a 14 bit dynamic hit logic scheme with an embedded 8K bit SRAM in IBM\´s 45nm SOI. The hit logic uses a "search-for-a-hit" scheme (i.e., XOR\´s followed by AND functions, pre-charged to a miss) to provide optimal performance, timing, and power. A custom microcode programmable Array-Built -In-Self-Test (ABIST) engine tests both the SRAM and hit logic function jointly, resulting in comprehensive "at-speed" test coverage to guarantee circuit functionality and timing margins. The SRAM is organized as a 64x15bx8W (way, or set) array and uses a 6T SRAM cell (1Read/1Write, 0.462μm2) in a "domino" hierarchal dual read bitline approach.
  • Keywords
    SRAM chips; built-in self test; cache storage; firmware; integrated circuit testing; microprogramming; silicon-on-insulator; timing circuits; ABIST; AND function; L1 cache look up structure; SOI; SRAM cell; XOR function; at-speed test coverage; bit rate 8 kbit/s; circuit functionality; circuit timing margin; core frequency; custom microcode programmable array-built-in-self-test; domino hierarchal dual read bitline; dynamic hit logic; embedded SRAM; logic function; search-for-a-hit scheme; size 45 nm; zEnterprise processor; Arrays; Delay; Driver circuits; Latches; Logic gates; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-61284-303-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.2011.5746224
  • Filename
    5746224