DocumentCode :
2893292
Title :
Threshold Analysis of Semiconductor Lasers: Novel Parameter Extraction Method
Author :
Toffano, Z. ; Destrez, A. ; Bozorgui, S.
fYear :
1996
fDate :
8-13 Sept. 1996
Firstpage :
262
Lastpage :
262
Keywords :
Current measurement; Equations; Laser modes; Laser transitions; Parameter extraction; Power lasers; Power measurement; Semiconductor lasers; Spontaneous emission; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3169-9
Type :
conf
DOI :
10.1109/CLEOE.1996.562447
Filename :
562447
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2893292
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