DocumentCode
2893292
Title
Threshold Analysis of Semiconductor Lasers: Novel Parameter Extraction Method
Author
Toffano, Z. ; Destrez, A. ; Bozorgui, S.
fYear
1996
fDate
8-13 Sept. 1996
Firstpage
262
Lastpage
262
Keywords
Current measurement; Equations; Laser modes; Laser transitions; Parameter extraction; Power lasers; Power measurement; Semiconductor lasers; Spontaneous emission; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location
Hamburg, Germany
Print_ISBN
0-7803-3169-9
Type
conf
DOI
10.1109/CLEOE.1996.562447
Filename
562447
Link To Document