Title :
Syntactic Patterns Recognition Applied to the APF Analyses
Author :
Carvalho, Strauss C. ; Montini, Denis Ávila ; Cardoso, Felipe Rafael Motta ; Santos, Alander ; Fernades, Danilo Douradinho ; Tasinaffo, Paulo Marcelo
Author_Institution :
Brazilian Aeronaut. Inst. of Technol. (ITA), Sao Jose dos Campos, Brazil
Abstract :
The evolution of technology has enabled research in several areas, one is the software manufacturing cells planning. There are several techniques for the study of design patterns. This line of research and development, small scale production, has been offered some computer systems dedicated to of design patterns analysis. The aim of this paper is to present the software implementation that uses Grammar of design patterns to validate string of characters in valid design patterns.
Keywords :
context-free grammars; object-oriented programming; pattern recognition; APF analyses; context free grammar; design patterns; software manufacturing cells planning; syntactic patterns recognition; Calibration; Character generation; Information analysis; Information technology; Manufacturing; Pattern analysis; Pattern recognition; Production planning; Research and development; Technology planning; CYK Algorithm; Context Free Grammar; Patterns Recognition and APF;
Conference_Titel :
Information Technology: New Generations (ITNG), 2010 Seventh International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-6270-4
DOI :
10.1109/ITNG.2010.84
