Title :
Nonlinear devices for threshold logic
Author_Institution :
General Electric Company,Syracuse,N.Y
Keywords :
Diodes; Electrical resistance measurement; Flip-flops; Laboratories; Logic devices; Logic gates; Magnetic analysis; Magnetic cores; Signal synthesis; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1962 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1962.1157403