A 28nm 0.6V low-power DSP for mobile applications

Author

Gammie, Gordon ; Ickes, Nathan ; Sinangil, Mahmut E. ; Rithe, Rahul ; Gu, J. ; Wang, Alice ; Mair, Hugh ; Datla, Satyendra ; Rong, Bing ; Honnavara-Prasad, Sushma ; Ho, Lam ; Baldwin, Greg ; Buss, Dennis ; Chandrakasan, Anantha P. ; Ko, Uming

Author_Institution

Texas Instrum., Dallas, TX, USA

fYear

2011

fDate

20-24 Feb. 2011

Firstpage

132

Lastpage

134

Abstract

A multimedia applications processor is fabricated using a 28nm low-power process technology for ultra-low-power applications. Based on a 4-issue, 32 register version of the TMS320C64X+ VLIW DSP, this System on Chip (SoC) includes 32kB L1 and 128kB L2 caches, and I2S, SPI, UART, MultiMediaCard, and external memory interfaces (Fig. 7.5.1). The design incorporates over 600k instances of custom low-voltage logic cells and 43 instances (1.6 Mb) of 6T SRAM. Utilizing ultra-low-voltage (ULV) optimized standard-cell libraries and 6T SRAM macros, and demonstrating a new statistical static timing analysis (SSTA) methodology, the SoC scales as designed from high performance at 1.0V down to ultra-low power at 0.6V.

Keywords

SRAM chips; cache storage; computer interfaces; digital signal processing chips; integrated logic circuits; logic design; low-power electronics; mobile radio; multimedia systems; multiprocessing systems; statistical analysis; system-on-chip; I2S; L2 caches; SPI; SRAM macros; SSTA methodology; SoC scales; TMS320C64X+; UART; VLIW DSP; custom low-voltage logic cells; external memory interfaces; low-power DSP; low-power process technology; mobile applications; multimedia applications processor; multimediacard; size 28 nm; statistical static timing analysis methodology; system on chip; ultra-low-power applications; ultra-low-voltage optimized standard-cell library; voltage 0.6 V; Clocks; Delay; Digital signal processing; Libraries; Random access memory; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International

Conference_Location

San Francisco, CA

ISSN

0193-6530

Print_ISBN

978-1-61284-303-2

Type

conf

DOI

10.1109/ISSCC.2011.5746251

Filename

5746251