DocumentCode :
2893670
Title :
Charge definition of transistor properties
Author :
Boothroyd, A.
Author_Institution :
Imperial College of Sci. and Tech., London, England
Volume :
V
fYear :
1962
fDate :
14-16 Feb. 1962
Firstpage :
30
Lastpage :
31
Keywords :
Circuit testing; Educational institutions; Electrodes; Performance evaluation; Power system transients; Predictive models; Steady-state; Switches; Transient response; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1962 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1962.1157417
Filename :
1157417
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2893670
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