Title :
A 14Gb/s high-swing thin-oxide device SST TX in 45nm CMOS SOI
Author :
Menolfi, Christian ; Toifl, Thomas ; Rueegg, Michael ; Braendli, Matthias ; Buchmann, Peter ; Kossel, Marcel ; Morf, Thomas
Author_Institution :
IBM Zurich Res. Lab., Rueschlikon, Switzerland
Abstract :
The limited supply voltage of today´s state-of-the-art CMOS technologies makes the design of high-speed transmitters at signaling swings above the typical 1 V supply a challenging task. Higher-voltage TX amplitude is not only required in older I/O standards and legacy applications, but also in emerging electro-optical extensions where high voltage swing combined with high-speed operation is desired. Higher swing also helps meet certain I/O standards in applications where losses introduced by high-density package constraints can be compensat ed to some extent. The source-series terminated (SST) driver is a versatile building block in a multi standard I/O TX thanks to its potential for low-power operation, its low area consumption, high CMOS-style circuit content, and flexible termination capability. Also, the SST driver supports single-ended output and differential operation. This contribution presents a high-swing SST TX based entirely on thin-oxide devices and using a split supply approach for driving the NMOS and the PMOS branches of the output driver, along with a static voltage protection scheme.
Keywords :
CMOS integrated circuits; MOSFET; driver circuits; integrated circuit packaging; low-power electronics; silicon-on-insulator; transmitters; CMOS SOI; I/O standards; NMOS transistor; PMOS transistor; bit rate 14 Gbit/s; electro-optical extensions; high-density package constraints; high-speed transmitter design; high-swing thin-oxide device SST TX; high-voltage TX amplitude; size 45 nm; source-series terminated driver; split supply approach; static voltage protection scheme; CMOS integrated circuits; CMOS technology; Clocks; Couplings; Driver circuits; Finite impulse response filter; MOS devices;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746262