Title :
An 800MS/s dual-residue pipeline ADC in 40nm CMOS
Author :
Mulder, Jan ; Van der Goes, Frank M L ; Vecchi, Davide ; Westra, Jan R. ; Ayranci, Emre ; Ward, Christopher M. ; Wan, Jiansong ; Bult, Klaas
Author_Institution :
Broadcom, Bunnik, Netherlands
Abstract :
The 800MS/S 12b pipeline ADC presented here achieves a 59dB peak SNDR while consuming 105mW, resulting in an FOM of 0.18pJ/conversion-step. With digital power dissipation decreasing with technology much faster than analog power consumption, power efficient ADC designs have to make use of calibration. A major advantage offered by the dual-residue ADC architecture is that the only calibration required is a calibration of the offset voltages of the MDAC amplifiers; a simple algorithm has been implemented that reaches convergence very rapidly and tracks the offsets for temperature drift and aging. Furthermore, the relaxed open-loop gain and bandwidth requirements of the MDACs allowed for a low-power implementation. Low power consumption is essential especially in applications where multiple high-speed ADCs have to be implemented on a single chip, such as 10GBase-T Ethernet.
Keywords :
amplifiers; analogue-digital conversion; CMOS; Ethernet; MDAC amplifier; analog power consumption; bandwidth requirement; calibration; digital power dissipation; dual-residue ADC architecture; dual-residue pipeline ADC; high speed ADC; low power consumption; peak SNDR; power 105 mW; power efficient ADC design; relaxed open-loop gain; size 40 nm; temperature drift; Calibration; Distortion measurement; Electronics packaging; Noise; Pipelines; System-on-a-chip; Transistors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746274