DocumentCode
2893986
Title
Heuristic Sensitivity in Guided Random-Walk Based Model Checking
Author
Bui, Thang H. ; Nymeyer, Albert
Author_Institution
Sch. of Comput. Sci. & Eng., Univ. of New South Wales, Sydney, NSW, Australia
fYear
2009
fDate
23-27 Nov. 2009
Firstpage
125
Lastpage
134
Abstract
In this work we combine the complementary worlds of model checking and simulation. Model checking is used to verify that a model of a system satisfies some property. In general it considers all inputs. In simulation, a model of a system is executed for particular inputs. Our combined approach, referred to here as formal model simulation, uses the same formal model as model checking, but abandons the notion of verification, which seeks to prove that there are no errors in the model, and instead uses a guided random-walk search algorithm to find errors. The ´guide´ is provided by an abstraction of the system, which for the purposes of this work, is done by hand. Normally it would be automatically generated by analysing the model. We implement the approach in a tool called granSPIN, and in a series of experiments, compare the performance of granSPIN against the conventional model checker SPIN. Novel here is the use of a heuristic to guide the random walk towards states of the model that possibly violate user-defined properties. We also confirm in this work an earlier proposed characterisation called the process error participation factor. This is a more thorough and extensive report of work that was briefly reported earlier.
Keywords
formal verification; search problems; formal model simulation; granSPIN; guided random-walk-based model checking; heuristic sensitivity; process error participation factor; search algorithm; verification notion; Australia; Computational modeling; Computer science; Computer simulation; Scalability; Software debugging; Software engineering; Testing; guided random walks; heuristic sensitivity; model checking;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering and Formal Methods, 2009 Seventh IEEE International Conference on
Conference_Location
Hanoi
Print_ISBN
978-0-7695-3870-9
Type
conf
DOI
10.1109/SEFM.2009.19
Filename
5368102
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