Title :
Heuristic Sensitivity in Guided Random-Walk Based Model Checking
Author :
Bui, Thang H. ; Nymeyer, Albert
Author_Institution :
Sch. of Comput. Sci. & Eng., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
In this work we combine the complementary worlds of model checking and simulation. Model checking is used to verify that a model of a system satisfies some property. In general it considers all inputs. In simulation, a model of a system is executed for particular inputs. Our combined approach, referred to here as formal model simulation, uses the same formal model as model checking, but abandons the notion of verification, which seeks to prove that there are no errors in the model, and instead uses a guided random-walk search algorithm to find errors. The ´guide´ is provided by an abstraction of the system, which for the purposes of this work, is done by hand. Normally it would be automatically generated by analysing the model. We implement the approach in a tool called granSPIN, and in a series of experiments, compare the performance of granSPIN against the conventional model checker SPIN. Novel here is the use of a heuristic to guide the random walk towards states of the model that possibly violate user-defined properties. We also confirm in this work an earlier proposed characterisation called the process error participation factor. This is a more thorough and extensive report of work that was briefly reported earlier.
Keywords :
formal verification; search problems; formal model simulation; granSPIN; guided random-walk-based model checking; heuristic sensitivity; process error participation factor; search algorithm; verification notion; Australia; Computational modeling; Computer science; Computer simulation; Scalability; Software debugging; Software engineering; Testing; guided random walks; heuristic sensitivity; model checking;
Conference_Titel :
Software Engineering and Formal Methods, 2009 Seventh IEEE International Conference on
Conference_Location :
Hanoi
Print_ISBN :
978-0-7695-3870-9
DOI :
10.1109/SEFM.2009.19