Title :
Improved K nearest neighbor classification algorithm
Author :
Qiao, Yu-Long ; Pan, Jeng-Shyang ; Sun, Sheng-he
Author_Institution :
Dept. of Autom. Test & Control, Harbin Inst. of Technol., China
Abstract :
A novel and efficient algorithm is proposed to reduce the computational complexity for KNN classification. It uses two important features, the approximation coefficient of a fully decomposed feature vector with Haar wavelet and the variance of the corresponding untransformed vector, to produce two efficient test conditions. Since those vectors that are impossible to be the k closest vectors in the design set are kicked out quickly by these conditions, this algorithm saves largely the classification time and have the same classification performance as that of the exhaustive search classification algorithm. Experimental results based on texture image classification verify our proposed algorithm.
Keywords :
Haar transforms; computational complexity; image classification; image texture; vectors; wavelet transforms; Haar wavelet transform; K nearest neighbor classification algorithm; approximation coefficient; computational complexity; k closest vectors; search classification algorithm; texture image classification; variance; Algorithm design and analysis; Automatic control; Automatic testing; Classification algorithms; Computational complexity; Electronic equipment testing; Image classification; Nearest neighbor searches; Pattern classification; Sun;
Conference_Titel :
Circuits and Systems, 2004. Proceedings. The 2004 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-8660-4
DOI :
10.1109/APCCAS.2004.1413076