• DocumentCode
    2894107
  • Title

    Thermal Modeling and Temperature Driven Placement for FPGAs

  • Author

    Bhoj, Shilpa ; Bhatia, Dinesh

  • Author_Institution
    Center for Integrated Circuits & Syst., Texas Univ., Richardson, TX
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    1053
  • Lastpage
    1056
  • Abstract
    With rapid technology scaling and increased use of FPGAs in mobile and low power applications, the effect of temperature on power, performance and reliability has become a challenge for system designers. In this work we make two major contributions to thermal aware design in FPGAs. First, we formulate a resistive mesh model for thermal profiling of FPGAs. The model exploits the characteristic features of the reconfigurable fabric to produce an efficient and accurate thermal estimate. We then employ the thermal model in a novel temperature driven placement tool for FPGAs. Our placement tool achieves an average temperature reduction of 2.26degC and produces a more uniform thermal distribution. The impact on frequency and wirelength is small with an average degradation of 5.28 and 4.15 percent respectively.
  • Keywords
    field programmable gate arrays; temperature distribution; FPGA; resistive mesh model; temperature driven placement; thermal modeling; thermal profiling; Fabrics; Field programmable gate arrays; Integrated circuit modeling; Power dissipation; Power system modeling; Power system reliability; Temperature distribution; Temperature sensors; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378190
  • Filename
    4252819