DocumentCode
2894131
Title
A 32Gb MLC NAND flash memory with Vth margin-expanding schemes in 26nm CMOS
Author
Kim, Tae-yun ; Lee, Sang-Don ; Park, Jin-su ; Cho, Ho-youb ; You, Byoung-sung ; Baek, Kwang-ho ; Lee, Jae-ho ; Yang, Chang-won ; Yun, Misun ; Kim, Min-su ; Kim, Jong-woo ; Jang, Eun-seong ; Chung, Hyun ; Lim, Sang-o ; Han, Bong-Seok ; Koh, Yo-Hwan
Author_Institution
Hynix Semicond., Icheon, South Korea
fYear
2011
fDate
20-24 Feb. 2011
Firstpage
202
Lastpage
204
Abstract
As the NAND flash memory market grows rapidly due to various applications, such as USB devices, MP3 players, SSDs, cellular phones, and cameras, there is a requirement for high-density and low-cost devices. Two different approaches to meet these requirements are increasing data per cell and area scaling. 3b/cell or 4b/cell NAND flash memories were introduced as an effective way to lower cost. However, these devices suffer from program performance degradation since tighter Vth distribution is required. On the other hand, area scaling is a candidate to achieve low cost while maintaining high program performance even though there are several hurdles to overcome, such as FG coupling and charge retention. As the cell size gets smaller, the Vth distribution widens and the erase-write cycling margin is decreased by the floating-gate coupling ratio.
Keywords
CMOS memory circuits; NAND circuits; flash memories; CMOS; MLC NAND flash memory; erase-write cycling margin; floating-gate coupling ratio; margin-expanding scheme; memory size 32 GByte; program performance degradation; Couplings; Flash memory; Logic gates; Memory management; Microprocessors; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-61284-303-2
Type
conf
DOI
10.1109/ISSCC.2011.5746282
Filename
5746282
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