Title :
The enhanced tunnel-diode logic circuit
Author :
Sear, B. ; Cubert, J. ; Chow, W.
Author_Institution :
Martin Marietta Corporation, Baltimore, MD, USA
Keywords :
Bandwidth; Circuit testing; Clocks; Delay; Diodes; Impedance; Logic circuits; Low voltage; Resistors; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157454
