Title :
Are transistors approaching their maximum capabilities?
Author :
Goldey, J. ; Ryder, R.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Keywords :
Bandwidth; Circuits; Current density; Delay effects; Equations; Frequency; Geometry; Space charge; Transistors; Velocity measurement;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157455
