Title :
Method of using parameter confidence limits in circuit design
Author_Institution :
General Electric Co., Syracuse, NY, USA
Keywords :
Circuit synthesis; Circuit topology; Design methodology; Digital circuits; Frequency; Microelectronics; Packaging; Power dissipation; Probability distribution; Temperature distribution;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157462
