Title :
Specifying transistor characteristics for worst-case switching circuit design
Author_Institution :
Motorola Semiconductor Products, Inc., Phoenix, AZ, USA
Keywords :
Capacitance; Capacitors; Charge measurement; Current measurement; Delay effects; Equations; Switching circuits; Temperature; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157463
