DocumentCode :
2894514
Title :
Solid-state sensors for process control
Author :
Stern, E.
Author_Institution :
IBM Corp., Yorktown Heights, NY, USA
Volume :
VI
fYear :
1963
fDate :
20-22 Feb. 1963
Firstpage :
60
Lastpage :
61
Keywords :
Delay; Electrical equipment industry; Electrical resistance measurement; Frequency conversion; Immune system; Instruments; Process control; Sensor systems; Solid state circuits; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1963.1157466
Filename :
1157466
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2894514
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