DocumentCode
2894514
Title
Solid-state sensors for process control
Author
Stern, E.
Author_Institution
IBM Corp., Yorktown Heights, NY, USA
Volume
VI
fYear
1963
fDate
20-22 Feb. 1963
Firstpage
60
Lastpage
61
Keywords
Delay; Electrical equipment industry; Electrical resistance measurement; Frequency conversion; Immune system; Instruments; Process control; Sensor systems; Solid state circuits; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1963.1157466
Filename
1157466
Link To Document