Title :
A fully-integrated 3-level DC/DC converter for nanosecond-scale DVS with fast shunt regulation
Author :
Kim, Wonyoung ; Brooks, David M. ; Wei, Gu-Yeon
Author_Institution :
Harvard Univ., Cambridge, MA, USA
Abstract :
In recent years, chip multiprocessor architectures have emerged to scale performance while staying within tight power constraints. This trend motivates per core/block dynamic voltage and frequency scaling (DVFS) with fast voltage transition. Given the high cost and bulk of off-chip DC/DC converters to implement multiple on-chip power domains, there has been a surge of interest in on-chip converters. This paper presents the design and experimental results of a fully integrated 3-level DC/DC converter that merges characteristics of both inductor-based buck and switched-capacitor (SC) converters. While off-chip buck converters show high conversion efficiency, their on-chip counterparts suffer from loss due to low quality inductors. With the help of flying capacitors, the 3-level converter requires smaller inductors than the buck converter, reducing loss and on-die area overhead. Compared to SC converters that need more com plex structures to regulate higher than half the input voltage, 3-level converters can efficiently regulate the output voltage across a wide range of levels and load currents. Measured results from a 130nm CMOS test-chip prototype demon strate nanosecond-scale voltage transition times and peak conversion efficiency of 77%.
Keywords :
DC-DC power convertors; power aware computing; 3-level converter; chip multiprocessor architectures; dynamic frequency scaling; dynamic voltage scaling; fast shunt regulation; fast voltage transition; fully-integrated 3-level DC/DC converter; inductor-based buck converters; nanosecond-scale DVS; off-chip buck converters; on-chip converters; on-chip power domains; on-die area overhead; power constraints; switched-capacitor converters; Converters; Current measurement; Inductors; Regulators; Shunt (electrical); Voltage control; Voltage measurement;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746313