DocumentCode
2894835
Title
Gain characterization of high-frequency linear-amplifier devices
Author
Hower, M.
Author_Institution
Bell Telephone Laboratories, Inc., Laureldale, PA, USA
Volume
VI
fYear
1963
fDate
20-22 Feb. 1963
Firstpage
90
Lastpage
91
Abstract
Small-signal power gain measurements of active devices at high frequencies involve ambiguities due to the effects of internal feedback, making it difficult to measure accurately and isolate critical device parameters. has led to the definitioa of a new device parameter called An extensive search for a definitive gain measurement Gain Figure. Specifically: GF x (Forward Gain) x (Reverse Loss). A rigorous analysis of a two-port shows that the product of forward gain and reverse loss is equal to a particular matrix representation and is independent of the source and load admittances. Moreover, a slight extension of the analysis shows that GF is independent of y, h, and z, i.e., h and z parameters may be substituted directly and gives GF = |y21/y12|2 = |h21/h12|2 = |z21/z12|2.
Keywords
Electrical resistance measurement; Feedback circuits; Gain measurement; Passive networks; Power amplifiers; Power measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1963.1157485
Filename
1157485
Link To Document