• DocumentCode
    2894835
  • Title

    Gain characterization of high-frequency linear-amplifier devices

  • Author

    Hower, M.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Laureldale, PA, USA
  • Volume
    VI
  • fYear
    1963
  • fDate
    20-22 Feb. 1963
  • Firstpage
    90
  • Lastpage
    91
  • Abstract
    Small-signal power gain measurements of active devices at high frequencies involve ambiguities due to the effects of internal feedback, making it difficult to measure accurately and isolate critical device parameters. has led to the definitioa of a new device parameter called An extensive search for a definitive gain measurement Gain Figure. Specifically: GF x (Forward Gain) x (Reverse Loss). A rigorous analysis of a two-port shows that the product of forward gain and reverse loss is equal to a particular matrix representation and is independent of the source and load admittances. Moreover, a slight extension of the analysis shows that GF is independent of y, h, and z, i.e., h and z parameters may be substituted directly and gives GF = |y21/y12|2 = |h21/h12|2 = |z21/z12|2.
  • Keywords
    Electrical resistance measurement; Feedback circuits; Gain measurement; Passive networks; Power amplifiers; Power measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1963.1157485
  • Filename
    1157485