DocumentCode

2894900

Title

The waffle iron store

Author

Finch, T. ; Bobeck, A.

Author_Institution

Bell Telephone Labs., Murray Hill, NJ, USA

Volume

VI

fYear

1963

fDate

20-22 Feb. 1963

Firstpage

12

Lastpage

13

Keywords

Detectors; Diodes; Driver circuits; Ferrites; Iron; Nickel; Silicon; Switches; Telephony; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1963.1157488

Filename

1157488