Title :
The waffle iron store
Author :
Finch, T. ; Bobeck, A.
Author_Institution :
Bell Telephone Labs., Murray Hill, NJ, USA
Keywords :
Detectors; Diodes; Driver circuits; Ferrites; Iron; Nickel; Silicon; Switches; Telephony; Temperature sensors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157488
