Status of FAR-TECH´S ECR Ion source optimization modeling

Author

Kim, J.S. ; Zhao, L. ; Cluggish, B.P. ; Bogatu, I.N. ; Galkin, S.A. ; Tangri, V. ; Pardo, R.

Author_Institution

FAR-TECH, Inc., San Diego

fYear

2007

fDate

25-29 June 2007

Firstpage

1829

Lastpage

1831

Abstract

FAR-TECH, Inc. has been building up a suite of comprehensive numerical tools for end-to-end electron cyclotron resonance ion source (ECRIS) modeling. They consist of the Monte Carlo beam capture (MCBC) code [1, 2], the generalized ECRIS modeling (GEM) code [3], and the ion extraction (IonEx) code [4]. The MCBC code simulates beam slowing down dynamics in a plasma due to Coulomb collisions, and includes ionization due to hot electrons and charge exchange. GEM models ECR plasmas by fluid ions and bounce averaged electrons. MCBC provides ion source profiles to GEM, which in turn provides ion flux profiles to IonEx. IonEx accurately models the plasma meniscus formed during ion extraction using an innovative, meshfree, particle-in-cloud-of-points technique. Extensions of GEM to two dimensions (2D) and IonEx to three dimensions (3D), as well as experimental validation are underway.

Keywords

Monte Carlo methods; ion sources; particle beam dynamics; Coulomb collisions; ECR ion source optimization; FAR-TECH; Monte Carlo beam capture code; beam slowing down dynamics; end-to-end electron cyclotron resonance ion source; generalized ECRIS modeling code; ion extraction; ion extraction code; particle-in-cloud-of-points technique; Cyclotrons; Electrons; Fluid dynamics; Ion sources; Ionization; Monte Carlo methods; Particle beams; Plasma simulation; Plasma sources; Resonance;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2007. PAC. IEEE

Conference_Location

Albuquerque, NM

Print_ISBN

978-1-4244-0916-7

Type

conf

DOI

10.1109/PAC.2007.4440912

Filename

4440912