Title :
Status of FAR-TECH´S ECR Ion source optimization modeling
Author :
Kim, J.S. ; Zhao, L. ; Cluggish, B.P. ; Bogatu, I.N. ; Galkin, S.A. ; Tangri, V. ; Pardo, R.
Author_Institution :
FAR-TECH, Inc., San Diego
Abstract :
FAR-TECH, Inc. has been building up a suite of comprehensive numerical tools for end-to-end electron cyclotron resonance ion source (ECRIS) modeling. They consist of the Monte Carlo beam capture (MCBC) code [1, 2], the generalized ECRIS modeling (GEM) code [3], and the ion extraction (IonEx) code [4]. The MCBC code simulates beam slowing down dynamics in a plasma due to Coulomb collisions, and includes ionization due to hot electrons and charge exchange. GEM models ECR plasmas by fluid ions and bounce averaged electrons. MCBC provides ion source profiles to GEM, which in turn provides ion flux profiles to IonEx. IonEx accurately models the plasma meniscus formed during ion extraction using an innovative, meshfree, particle-in-cloud-of-points technique. Extensions of GEM to two dimensions (2D) and IonEx to three dimensions (3D), as well as experimental validation are underway.
Keywords :
Monte Carlo methods; ion sources; particle beam dynamics; Coulomb collisions; ECR ion source optimization; FAR-TECH; Monte Carlo beam capture code; beam slowing down dynamics; end-to-end electron cyclotron resonance ion source; generalized ECRIS modeling code; ion extraction; ion extraction code; particle-in-cloud-of-points technique; Cyclotrons; Electrons; Fluid dynamics; Ion sources; Ionization; Monte Carlo methods; Particle beams; Plasma simulation; Plasma sources; Resonance;
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
DOI :
10.1109/PAC.2007.4440912
