Title :
A semiconductor network multiplex switch
Author :
Luecke, G. ; Owen, William
Author_Institution :
Texas Instruments, Inc., Dallas, TX, USA
Keywords :
Breakdown voltage; Capacitance; Capacitors; Fault location; Instruments; Low voltage; Semiconductor diodes; Switches; Switching circuits; Temperature;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157493
