DocumentCode
2895166
Title
Sampling from the exponential distribution using independent Bernoulli variates
Author
Thomas, David B. ; Luk, Wayne
Author_Institution
Dept. of Comput., Imperial Coll. London, London
fYear
2008
fDate
8-10 Sept. 2008
Firstpage
239
Lastpage
244
Abstract
The exponential distribution is a key distribution in many event-driven Monte-Carlo simulations, where it is used to model the time between random events in the system. This paper shows that each bit of a fixed-point exponential random variate is an independent Bernoulli variate, allowing the bits to be generated in parallel. This parallelism is of little interest in software, but is particularly well suited to FPGA generators, where huge numbers of independent uniform bits can be cheaply generated per cycle. Two generation architectures are developed using this approach, one using only logic elements to generate individual bits, and another using block-RAMs to group multiple bits together. The two methods are evaluated at three different quality-resource trade-offs, and when compared to existing methods have both higher performance and better resource utilisation. The method is particularly useful for very high performance applications, as extremely high-quality 36-bit exponential variates can be generated at 600MHz in the Virtex-4 architecture, using just 880 slices and no block-RAMs or embedded DSP blocks.
Keywords
Monte Carlo methods; exponential distribution; field programmable gate arrays; random-access storage; sampling methods; FPGA generators; block-RAM; event-driven Monte-Carlo simulations; exponential distribution; fixed-point exponential random variate; independent Bernoulli variates; sampling method; Distributed computing; Educational institutions; Entropy; Exponential distribution; Field programmable gate arrays; Gaussian distribution; Logic; Parallel processing; Random number generation; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
Conference_Location
Heidelberg
Print_ISBN
978-1-4244-1960-9
Electronic_ISBN
978-1-4244-1961-6
Type
conf
DOI
10.1109/FPL.2008.4629938
Filename
4629938
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