DocumentCode :
2895168
Title :
A 28nm 6T SRAM memory compiler with a variation tolerant replica circuit
Author :
Gupta, Swastik ; Rana, Pravin
Author_Institution :
External Dev. & Manuf. (EDM), Texas Instrum. India Pvt. Ltd., Bangalore, India
fYear :
2012
fDate :
4-7 Nov. 2012
Firstpage :
458
Lastpage :
461
Abstract :
We propose an SRAM replica tracking circuit that reduces divergence of the replica path relative to normal read path (6-16% less Sense differential Requirement), thus improving the access time by 5-8%. The approach is compatible to power managed SRAMs having Retain till Access feature and also for non power managed SRAMs with no sense differential impact. Using This Replica tracing circuit Sense differential has been well tracked across all array and periphery voltages combinations which further improve the access time by 4-6%. Instances with this method 0.5-256Kb have been tested on a 28nm CMOS LP process.
Keywords :
CMOS integrated circuits; SRAM chips; 6T SRAM memory compiler; CMOS LP process; SRAM replica tracking circuit; retain-till-access feature; size 28 nm; storage capacity 0.5 Kbit to 256 Kbit; variation tolerant replica circuit; Arrays; Decoding; Delay; Generators; Rails; Random access memory; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
Type :
conf
DOI :
10.1109/ISOCC.2012.6406895
Filename :
6406895
Link To Document :
بازگشت