• DocumentCode
    2895168
  • Title

    A 28nm 6T SRAM memory compiler with a variation tolerant replica circuit

  • Author

    Gupta, Swastik ; Rana, Pravin

  • Author_Institution
    External Dev. & Manuf. (EDM), Texas Instrum. India Pvt. Ltd., Bangalore, India
  • fYear
    2012
  • fDate
    4-7 Nov. 2012
  • Firstpage
    458
  • Lastpage
    461
  • Abstract
    We propose an SRAM replica tracking circuit that reduces divergence of the replica path relative to normal read path (6-16% less Sense differential Requirement), thus improving the access time by 5-8%. The approach is compatible to power managed SRAMs having Retain till Access feature and also for non power managed SRAMs with no sense differential impact. Using This Replica tracing circuit Sense differential has been well tracked across all array and periphery voltages combinations which further improve the access time by 4-6%. Instances with this method 0.5-256Kb have been tested on a 28nm CMOS LP process.
  • Keywords
    CMOS integrated circuits; SRAM chips; 6T SRAM memory compiler; CMOS LP process; SRAM replica tracking circuit; retain-till-access feature; size 28 nm; storage capacity 0.5 Kbit to 256 Kbit; variation tolerant replica circuit; Arrays; Decoding; Delay; Generators; Rails; Random access memory; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2012 International
  • Conference_Location
    Jeju Island
  • Print_ISBN
    978-1-4673-2989-7
  • Electronic_ISBN
    978-1-4673-2988-0
  • Type

    conf

  • DOI
    10.1109/ISOCC.2012.6406895
  • Filename
    6406895