Author :
Teh, Chen Kong ; Fujita, Tetsuya ; Hara, Hiroyuki ; Hamada, Mototsugu
Abstract :
Flip-flops (FF) typically consume more than 50% of random-logic power in an SoC chip, due to their redundant transition of internal nodes, when the input and the output are in the same state. Several low-power techniques have been proposed, but all of them incur transistor-count penalties, leading to an increase in size, which is too costly since flip-flops typically account for 50% of random-logic area. In this work, we design and test a D-flip-flop, known as adaptive-coupling flip-flop (ACFF), which has a reduced transistor count compared to other low-power flip-flops, and 2 fewer transistors than the mainstream transmission-gate flip-flop (TGFF). ACFF features a single-phase clocking structure, with no local clock buffer and no precharging stage, enabling it to be more energy efficient than TGFF, where up to 77% energy saving is achieved at 0% data activity. ACFF also has an adaptive-coupling configuration, which weakens state retention coupling during a transition, allowing it to be tolerant to process variations. Test chips are fabricated in a 40nm CMOS technology for 1.1V application, and 500k ACFFs are tested over all chips in 5 skew wafers. All tested ACFFs are fully functional down to 0.75V supply voltage, with spreads of timing parameters comparable to TGFF. We also demonstrate a P&R test by employing ACFF to a wireless LAN chip, and the results indicate chip power is reduced by as much as 24%.
Keywords :
CMOS integrated circuits; flip-flops; integrated circuit design; integrated circuit testing; logic design; logic testing; low-power electronics; CMOS technology; P&R test; SoC chip; adaptive-coupling configuration; adaptive-coupling flip-flop; data activity; energy saving; low-power flip-flop; low-power technique; random-logic area; random-logic power; reduced transistor count; single-phase-clocking D-flip-flop; size 40 nm; state retention coupling; test chip; timing parameter; transistor-count penalty; transmission-gate flip-flop; voltage 1.1 V; wireless LAN chip; Clocks; Delay; Flip-flops; Logic gates; Semiconductor device measurement; Transistors;