Title :
An integrated charge-control J-K flip-flop
Author :
Davies, D. ; Seeds, R. ; Shou, S.
Author_Institution :
Fairchild Semiconductor, Mountain View, CA, USA
Keywords :
Charge transfer; Circuit testing; Clocks; Counting circuits; Delay; Diodes; Equations; Flip-flops; Pulse circuits; Timing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157522
