• DocumentCode
    2895656
  • Title

    Online Computing and Predicting Architectural Vulnerability Factor of Microprocessor Structures

  • Author

    Pan, Songjun ; Hu, Yu ; Li, Xiaowei

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2009
  • fDate
    16-18 Nov. 2009
  • Firstpage
    345
  • Lastpage
    350
  • Abstract
    Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft error tolerance techniques (such as redundant multithreading and instruction duplication) can achieve high fault coverage but at the cost of significant performance degradation. Prior research reports that soft errors can be masked at the architecture level, and the degree of such masking, named as architecture vulnerability factor (AVF), can vary significantly across workloads and individual structures, hence strict redundant execution may not be necessary for soft error tolerance. In this work, we exploit the AVF varying feature to adaptively tune reliability and performance. We present an infrastructure to online compute and predict AVF for three microprocessor structures (IQ, ROB, and LSQ), guiding when the protection scheme should be activated to improve reliability. Experimental results show that our method can efficiently compute the AVF for different structures independent of hardware configurations. The average differences between our method and a prior offline AVF computing method are 0.10, 0.01, and 0.039 for IQ, ROB, and LSQ, respectively.
  • Keywords
    circuit reliability; logic CAD; logic design; microprocessor chips; multi-threading; architectural vulnerability factor prediction; instruction duplication; microprocessor design; microprocessor structures; online computing; redundant multithreading; soft error tolerance techniques; Computer architecture; Computer errors; Degradation; Error correction codes; Hardware; Material storage; Microarchitecture; Microprocessors; Multithreading; Protection; architecture vulnerability factor; microarchitecture; performance; reliability; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2009. PRDC '09. 15th IEEE Pacific Rim International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3849-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2009.61
  • Filename
    5368198