Title :
Gate noise in silicon field-effect transistors
Author :
Blair, L. ; Adler, Rasmus
Author_Institution :
Analytic Services, Inc., Bailey´´s Crossroads, VA, USA
Keywords :
Circuit noise; FETs; Frequency; Low-frequency noise; Noise figure; Noise generators; Noise measurement; Semiconductor device noise; Signal to noise ratio; Silicon;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157534
