Title :
A 300mm wafer-size CMOS image sensor with in-pixel voltage-gain amplifier and column-level differential readout circuitry
Author :
Yamashita, Yuichiro ; Takahashi, Hidekazu ; Kikuchi, Shin ; Ota, Keisuke ; Fujita, Masato ; Hirayama, Satoshi ; Kanou, Taikan ; Hashimoto, Sakae ; Momma, Genzo ; Inoue, Shunsuke
Author_Institution :
Canon, Kawasaki, Japan
Abstract :
In this paper, we describe the architecture of a wafer-size CMOS image sensor enabling to enlarge the size of the large-format sensor while maintaining good signal quality. The good signal quality is the key for a low-noise and high-frame rate image sensor. For this purpose, each pixel of our sensor has a programmable voltage amplifier. In addition, the differential readout circuitry on the column signal path ensures tolerance to common-mode noise and the drift of power/ground voltage.
Keywords :
CMOS image sensors; amplifiers; column-level differential readout circuitry; common-mode noise; high-frame rate image sensor; in-pixel voltage-gain amplifier; low-noise image sensor; power-ground voltage; programmable voltage amplifier; signal quality; size 300 mm; wafer-size CMOS image sensor; CMOS image sensors; Conferences; Electronics packaging; Noise; Pixel; Sensors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746373
