• DocumentCode
    2895911
  • Title

    A 128×96 pixel event-driven phase-domain ΔΣ-based fully digital 3D camera in 0.13μm CMOS imaging technology

  • Author

    Walker, Richard J. ; Richardson, Justin A. ; Henderson, Robert K.

  • Author_Institution
    Univ. of Edinburgh, Edinburgh, UK
  • fYear
    2011
  • fDate
    20-24 Feb. 2011
  • Firstpage
    410
  • Lastpage
    412
  • Abstract
    Low-cost 3D image capture devices are enabling new applications in the gaming, robotics, automotive and surveillance industries. A number of approaches are competing for a share of these markets. Stereoscopic cameras employ intensive image processing to interpret distance from the correlation of two separate image streams [1], structured light systems analyse the deformation of pat terned light projected over the scene, while time-of-flight (TOF) cameras require custom frequency-modulated image sensors and optical sources to measure the phase or return time of reflected light pulses. As rapid progress is made on com pact, high-frequency NIR LEDs, much research is being devoted to improve ments in the size, sensitivity and resolution of TOF image sensors. Analog pixel approaches provide compact pixel implementations but accuracy is limited by noise sources and nonlinearities of the analog electronics [2]. Single Photon Avalanche Diodes (SPADs) circumvent these issues and enable fully digital dis tance computation down to millimetric accuracy [3] by either direct or indirect demodulation schemes.
  • Keywords
    CMOS image sensors; avalanche diodes; cameras; delta-sigma modulation; demodulation; stereo image processing; ΔΣ-based fully digital 3D camera; 3D image capture devices; CMOS imaging technology; NIR LED; SPAD; TOF cameras; TOF image sensors; analog electronics; analog pixel approaches; compact pixel implementations; custom frequency-modulated image sensors; event-driven phase-domain; fully digital distance computation; image streams; indirect demodulation scheme; intensive image processing; millimetric accuracy; optical sources; patterned light; reflected light pulses; single photon avalanche diodes; size 0.13 mum; stereoscopic cameras; structured light systems; time-of-flight cameras; CMOS integrated circuits; Image sensors; Light emitting diodes; Optical variables measurement; Pixel; Radiation detectors; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-61284-303-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.2011.5746374
  • Filename
    5746374